When natural radiation disturbs electronics: The physics of singular events
Aix-Marseille Université, Institut de Physique de Rennes (IPR, UMR 6251) and Institut Matériaux Microélectronique & Nanosciences de Provence (IM2NP, UMR 7334)
Singular events induced by natural radiation in integrated circuits are now one of the most important mechanisms limiting the reliability of electronics on earth. The extreme miniaturization and growing complexity of circuits have made them increasingly sensitive not only to neutrons, protons and muons from atmospheric showers, but also to alpha particles emitted within them by tiny traces of radioactive impurities that semiconductor manufacturers seek to eliminate.
This talk will provide an overview of the physics of singular events, from natural radiation metrology to the numerical simulation of logic hazards at the device and CMOS circuit level, via the modeling of particle-matter interaction mechanisms and the collection of charges created by particles within semiconductor materials. The aim of our current research is to explore the emerging physical mechanisms responsible for singular events in nanometric digital circuits, with a focus on developing a predictive simulation chain for the radiative reliability of future nanotechnologies.